DETECTING DELAY FAULTS USING POWER SUPPLY TRANSIENT SIGNAL ANALYSIS

  • M N EZE Enugu State University of Science and Technology (ESUT), Enugu , Enugu State, Nigeria
  • I I ENEH Enugu State University of Science and Technology (ESUT), Enugu , Enugu State, Nigeria
Keywords: Transient Signal Analysis, competitive Ie market, Adefect- oriented test method

Abstract

A delay - fault testing strategy based on the analysis of power supply transient signal is presented. The method is an extension to a Go/No - Go device testing -method called Transient Signal Analysis (TSA) [1] TSA detects  through the analysis of a set
of power supply transient wavefonns in the time or frequency domain e.g. Fourier phase components. A teeent extension to TSA demonstrated a correlation between the Fourier phase component and path delays in defect - free device [2] The method proposed here is able to detect increases in delay due to resistive shorting and open defects using a simIlar technique. In patflcular, simulation results show that a delay defective device can be distinguished from a defect - free device through anomaly in the Fourier phase correlation profile of the device

Author Biographies

M N EZE, Enugu State University of Science and Technology (ESUT), Enugu , Enugu State, Nigeria

Department of Electrical and Electronics Engineering

I I ENEH, Enugu State University of Science and Technology (ESUT), Enugu , Enugu State, Nigeria

Department of Electrical and Electronics Engineering

Published
2018-08-15
Section
Articles